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Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

60.60 Standard published

N022 more

VSB - Parallel Sub-system Bus of the IEC 60821 VMEbus

60.60 Standard published

N065 more

High-voltage direct current (HVDC) installations - System tests

60.60 Standard published

N022 more

High-voltage direct current (HVDC) installations - System tests

60.60 Standard published

N022 more

High-voltage direct current (HVDC) installations - System tests

60.60 Standard published

N022 more

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

60.60 Standard published

N086 more

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

60.60 Standard published

N086 more

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

60.60 Standard published

N086 more

Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements

60.60 Standard published

N022 more

Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances

60.60 Standard published

N022 more

Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions

60.60 Standard published

N022 more

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

60.60 Standard published

N022 more

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

60.60 Standard published

N022 more

Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

10.99 New project approved

N022 more

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

10.99 New project approved

N022 more

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

40.60 Close of voting

N022 more

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

N022 more

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

40.60 Close of voting

N086 more