Projekti
Pretražite srpske, evropske i međunarodne standarde. Odredite organizaciju koja je donosilac standarda, izaberite oznaku standarda ili ključnu reč i završite željenu pretragu. Možete dodati i fazu u izradi standarda ili komitet/komisiju koja je izradila standard.
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
50.00
Evidentiranje podataka o definitivnom tekstu nacrta standarda
Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module
40.60
Završetak javne rasprave
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
Thermal standardization on semiconductor packages - Part 2-2: 3D thermal simulation models of semiconductor packages for steady-state analysis - PBGA and FBGA packages
30.20
Početak izjašnjavanja o nacrtu komisije standarda
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
60.00
Standard u postupku objavljivanja
Thermal standardization on semiconductor packages - Part 4: Thermal evaluation board specifications for fine pitch semiconductor packages
30.20
Početak izjašnjavanja o nacrtu komisije standarda
Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
Thermal standardization on semiconductor packages - Part 6-1: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points - Model creation method using a datasheet of semiconductor device
20.99
Prednacrt standarda prihvata se kao nacrt standarda
Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices
30.20
Početak izjašnjavanja o nacrtu komisije standarda
Required Specification Of Package Substrates For Advanced Semiconductor Packaging - Part 1: Current-Induced Quality Test Method for Package Substrate
20.99
Prednacrt standarda prihvata se kao nacrt standarda
Part model guideline for electronic-device packages - XML requirements
20.99
Prednacrt standarda prihvata se kao nacrt standarda
