Пројекти

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

60.60   Стандард објављен

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

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Multimedia systems and equipment - Multimedia e-publishing and e-books - Interchange format for e-dictionaries

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General requirements for arc fault detection devices

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Amendment 1 - General requirements for arc fault detection devices

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Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)

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Corrigendum 1 - Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)

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Corrigendum 1 - General requirements for arc fault detection devices

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Nanomanufacturing - Key control characteristics - Part 11-1: Electromagnetic compatibility - Shielding effectiveness of nanomaterials: near-field probe method

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Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

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Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes

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Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method

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Nanomanufacturing - Key control characteristics - Part 2-6: Carbon nanotube-related products - Thermal diffusivity of vertically-aligned carbon nanotubes: flash method

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Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:

90.93   Одлука о потврђивању стандарда

Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency

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Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion

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Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)

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Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method

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