Ревидиран
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
ПОВУЧЕН
IEC 61280-2-2:1998 ED1
ПОВУЧЕН
IEC 61280-2-2:2005 ED2
99.60
Повлачење ступило на снагу
11. 3. 2008.
ПОВУЧЕН
IEC 61280-2-2:2008 ED3