Повучен
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
ПОВУЧЕН
ISO 11505:2012
95.99
Повучен
19. 6. 2025.
ОБЈАВЉЕН
ISO 11505:2025