Пројекти

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

30.20   Почетак изјашњавања о нацрту комисије стандарда

Amendment 1 - Electrical accessories - Residual current monitors (RCMs) - Part 1: RCMs for household and similar uses

40.20   Нацрт на јавној расправи 60 дана

Passive RF and microwave devices, intermodulation level measurement - Part 7: Field measurements of passive intermodulation

60.00   Стандард у поступку објављивања

Uninterruptible power systems (UPS) - Part 1: Safety requirements

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Uninterruptible power systems (UPS) - Part 5-1: DC output UPS - Safety requirements

20.99   Преднацрт стандарда прихвата се као нацрт стандарда

Amendment 1 - Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements

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Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level

30.99   Нацрт комисије стандарда одобрава се за јавну расправу

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

50.00   Евидентирање података о дефинитивном тексту нацрта стандарда

Semiconductor devices - Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology – Measurement method of tensile strength of microstructures

40.20   Нацрт на јавној расправи 60 дана

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

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Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

50.20   Почетак поступка одобравања дефинитивног текста нацрта стандарда

Semiconductor devices - Micro-electromechanical systems - Part 57: RF MEMS directional coupler

40.20   Нацрт на јавној расправи 60 дана

Semiconductor devices - Micro-electromechanical systems - Part 58: Test methods for performances of MEMS thermopile devices

40.20   Нацрт на јавној расправи 60 дана

Semiconductor devices - Micro-electromechanical systems-Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

40.20   Нацрт на јавној расправи 60 дана

Semiconductor devices - Micro-electromechanical systems - Part 60: Test methods for sensing performances of MEMS resonant electric-field-sensitive devices

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Semiconductor devices - Micro-electromechanical systems - Part 61: Evaluation methods of localized deformation and stretchability for Hybrid MEMS materials

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Semiconductor devices - Micro-electromechanical systems - Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation

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Semiconductor devices - Micro-electromechanical systems - Part 63: Tensile test method for shape-memory characteristics of MEMS materials under thermomechanical loading

30.20   Почетак изјашњавања о нацрту комисије стандарда