10.20 10. 4. 2026.
ISO
ISO/TC 107
Међународни стандард
This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a semi-transparent layer and for the determination of the optical (refractive index n and extinction coefficient k) or dielectric (real part ε1 and imaginary part ε2) constants/functions based on the semi-transparent single layer model.
ПРОЈЕКАТ
ISO/NP 23131-4
10.20
Почетак изјашњавања о предлогу
10. 4. 2026.