Замењен
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
ПОВУЧЕН
IEC PAS 62189:2000 ED1
99.60
Повлачење ступило на снагу
23. 2. 2004.
ПОВУЧЕН
IEC 60749-23:2004 ED1