Zamenjen
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
POVUČEN
IEC PAS 62189:2000 ED1
99.60
Povlačenje stupilo na snagu
23. 2. 2004.
POVUČEN
IEC 60749-23:2004 ED1