20.60 9. 9. 2025.
ISO
ISO/TC 206
Међународни стандард
This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.
ПРОЈЕКАТ
ISO/WD 25797
20.60
Завршетак рада на преднацрту стандарда
9. 9. 2025.