30.60 23. 9. 2026.
ISO
ISO/TC 206
Međunarodni standard
This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.
PROJEKAT
ISO/CD 25797
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
23. 9. 2026.