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ISO/WD 25797

Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for determining amount-of-substance of deposited materials and physical film thickness by using X-ray fluorescence spectrometry

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20.60     9. 9. 2025.

ISO

ISO/TC 206

Međunarodni standard

Apstrakt

This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.

Životni ciklus

TRENUTNO

PROJEKAT
ISO/WD 25797
20.60 Završetak rada na prednacrtu standarda
9. 9. 2025.