30.20 28. 7. 2026.
ISO
ISO/TC 206
Međunarodni standard
This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.
PROJEKAT
ISO/CD 25797
30.20
Početak izjašnjavanja o nacrtu komisije standarda
28. 7. 2026.
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