30.60 Sep 23, 2026
ISO
ISO/TC 206
International Standard
This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.
PROJECT
ISO/CD 25797
30.60
Close of voting/ comment period
Sep 23, 2026