naSRPS EN IEC 63378-6:2023

Термичка стандардизација на кућиштима полупроводника — Део 6: Модул термичке отпорности и капацитансе за предвиђање температурних транзијената на споју и мерним тачкама

Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

Апстракт

IEC 63378-6:2026 specifies a thermal resistance and capacitance model for semiconductor packages. This model is named the digital transformation using thermal resistance and capacitance (DXRC) model. It predicts transient temperature at junction and measurement points.

This document applies to semiconductor packages such as TO-252, TO-263, and HSOP. It supports single chip packages dissipated heat from single package surface.