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Reliability growth - Stress testing for early failures in unique complex systems
60.60 Standard published
Environmentally conscious design (ECD) - Principles, requirements and guidance
60.60 Standard published
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
60.60 Standard published
EMC IC modelling - Part 1: General modelling framework
60.60 Standard published
EMC IC modelling - Part 1: General modelling framework
60.60 Standard published
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
60.60 Standard published
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
60.60 Standard published
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
90.93 Standard confirmed
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
60.60 Standard published
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
90.93 Standard confirmed