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Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.60 Close of voting
High-level test description table for development of production test programs
40.60 Close of voting
Evaluation methods for protection against risk of fire in electric tumble dryers
10.99 New project approved
Atmospheric and altitude correction
20.99 WD approved for registration as CD
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
50.60 Close of voting. Proof returned by secretariat
Interpretation of dissolved gas analysis (DGA) in natural and synthetic esters
50.60 Close of voting. Proof returned by secretariat
Composite insulated cross-arms with AC rated voltage greater than 1 000 V and DC voltage greater than 1 500 V – Definitions, design criteria, test methods and acceptance criteria
20.99 WD approved for registration as CD
Industrial networks - 5G Communication Technology - Part 1: Terms, definitions and fundamentals
40.60 Close of voting
Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock
40.60 Close of voting
General requirements for tap adapter of capacitance graded bushing
20.99 WD approved for registration as CD
Horticultural lighting - LED modules for horticultural lighting - Safety
40.60 Close of voting
Fibre optic interconnecting devices and passive components - Performance standard for railway rolling stock application - Part 1: General and guidance
40.60 Close of voting
NFC Forum Specifications - Part 1: NFC Wireless Charging
40.20 DIS ballot initiated: 12 weeks
NFC Forum Specifications - Part 2: NFC Data Exchange Format
40.20 DIS ballot initiated: 12 weeks