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Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
60.60
Standard published
Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval
60.60
Standard published
Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
60.60
Standard published
Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
60.60
Standard published
Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
60.60
Standard published
Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
60.60
Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
60.60
Standard published
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
60.60
Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
60.60
Standard published
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
60.60
Standard published
