Projects

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

30.60   Close of voting/ comment period

Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

30.99   CD approved for registration as DIS

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

50.20   Proof sent to secretariat or FDIS ballot initiated: 8 weeks

Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes

50.99   FDIS or proof approved for publication

Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

30.99   CD approved for registration as DIS

Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

20.99   WD approved for registration as CD

Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

20.99   WD approved for registration as CD

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.60   Close of voting

Standard test procedures for semiconductor X-ray energy spectrometers

20.99   WD approved for registration as CD

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements

40.20   DIS ballot initiated: 12 weeks

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols

60.00   Standard under publication

Nuclear facilities - Electrical equipment important to safety - Qualification

40.20   DIS ballot initiated: 12 weeks

Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry

20.99   WD approved for registration as CD

Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry

20.99   WD approved for registration as CD

Optical fibres - Part 1-47: Measurement methods and test procedures - Macrobending loss

40.20   DIS ballot initiated: 12 weeks

Optical fibres - Part 1-49: Measurement methods and test procedures - Differential mode delay

20.99   WD approved for registration as CD

Optical fibres - Part 1-50: Measurement methods and test procedures - Damp heat (steady state) tests

40.20   DIS ballot initiated: 12 weeks

Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests

40.20   DIS ballot initiated: 12 weeks