0 Items
My account
Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

IEC 60749-29 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

General information

40.60     Apr 24, 2026

IEC

TC 47

International Standard

31.080.01  

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-29:2011 ED2

NOW

PROJECT
IEC 60749-29 ED3
40.60 Close of voting
Apr 24, 2026

National adoptions

naSRPS EN IEC 60749-29:2026  
ISS

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.60   Close of voting

N022 more