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IEC 60749-29 ED3

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

General information

40.20     Jan 30, 2026

PRVC    Apr 24, 2026

IEC

TC 47

International Standard

31.080.01  

Buying

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Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-29:2011 ED2

NOW

PROJECT
IEC 60749-29 ED3
40.20 DIS ballot initiated: 12 weeks
Jan 30, 2026

National adoptions

naSRPS EN IEC 60749-29:2026  
ISS

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.60   Close of voting

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