Projects

Safety of machinery - Application of protective equipment to detect the presence of persons

50.60   Close of voting. Proof returned by secretariat

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

40.99   Full report circulated: DIS approved for registration as FDIS

Semiconductor devices - Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology – Measurement method of tensile strength of microstructures

30.99   CD approved for registration as DIS

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

30.99   CD approved for registration as DIS

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

40.60   Close of voting

Semiconductor devices - Micro-electromechanical systems - Part 57: RF MEMS directional coupler

30.99   CD approved for registration as DIS

Semiconductor devices - Micro-electromechanical systems - Part 58: Test methods for performances of MEMS thermopile devices

30.99   CD approved for registration as DIS

Semiconductor devices - Micro-electromechanical systems-Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

30.99   CD approved for registration as DIS

Semiconductor devices - Micro-electromechanical systems - Part 60: Test methods for sensing performances of MEMS resonant electric-field-sensitive devices

20.99   WD approved for registration as CD

Semiconductor devices - Micro-electromechanical systems - Part 61: Evaluation methods of localized deformation and stretchability for Hybrid MEMS materials

20.99   WD approved for registration as CD

Semiconductor devices - Micro-electromechanical systems - Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation

20.99   WD approved for registration as CD

Semiconductor devices - Micro-electromechanical systems - Part 63: Tensile test of shape-memory MEMS materials under elevated temperature

20.99   WD approved for registration as CD

Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipment

40.00   DIS registered

Accuracy test method for static electricity meters under dynamic load conditions

20.99   WD approved for registration as CD

Electricity metering equipment - Particular requirements - Part 21: Static meters for AC active energy (classes 0,5, 1 and 2)

40.00   DIS registered

Electricity metering equipment - Particular requirements - Part 22: Static meters for AC active energy (classes 0,1S, 0,2S and 0,5S)

40.00   DIS registered

Electricity metering equipment - Particular requirements - Part 24: Static meters for fundamental component reactive energy (classes 0,5S, 1S, 1, 2 and 3)

40.00   DIS registered

Electricity metering equipment - Particular requirements - Part 25: Digital revenue meters for AC active energy (class 0,01 D) and AC reactive energy (class 0,01 D)

50.20   Proof sent to secretariat or FDIS ballot initiated: 8 weeks