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IEC 63142 ED1

A global methodology for reliability data prediction of electronic components

General information

30.98     Jul 6, 2023

IEC

TC 56

International Standard

Life cycle

NOW

ABANDON
IEC 63142 ED1
30.98 Project deleted
Jul 6, 2023

National adoptions

A global methodology for reliability data prediction of electronic components

10.99   New project approved

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