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IEC 60747-8-4:2004 ED1

Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications

Sep 24, 2004
95.99   Withdrawal of Standard   Dec 31, 2013

General information

95.99     Dec 31, 2013

IEC

TC 47/SC 47E

International Standard

31.080.30  

English   French  

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Replaced

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Scope

Gives details for the following categories of metal-oxide semiconductor field-effect transistors (MOSFETs) with inverse diodes:
type B depletion (normally on) type and Type C enhancement (normally off) type.

Life cycle

NOW

WITHDRAWN
IEC 60747-8-4:2004 ED1
95.99 Withdrawal of Standard
Dec 31, 2013

REVISED BY

PUBLISHED
IEC 60747-8:2010 ED3