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IEC TS 62607-10-2 ED1

Nanomanufacturing - Key control characteristics - Part 10-2: Nanoelectronic products - Resistance: conductive probe atomic force microscopy

General information

30.60     May 16, 2025

IEC

TC 113

Technical Specification

07.120  

Life cycle

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PROJECT
IEC TS 62607-10-2 ED1
30.60 Close of voting/ comment period
May 16, 2025