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IEC 63492-1 ED1

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

General information

30.60     Apr 25, 2025

ACD    May 31, 2026

IEC

TC 47

International Standard

31.080.01  

Life cycle

NOW

PROJECT
IEC 63492-1 ED1
30.60 Close of voting/ comment period
Apr 25, 2025

National adoptions

prSRPS EN IEC 63492-1:2023  
ISS

Semiconductor devices - Isolation for semiconductor devices - Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

10.99   New project approved

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