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IEC 60512-25-6:2004 ED1

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

May 26, 2004

General information

60.60     May 26, 2004

IEC

TC 48/SC 48B

International Standard

31.220.10  

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Scope

Describes methods for measuring an eye pattern response and jitter in the time domain.

Life cycle

NOW

PUBLISHED
IEC 60512-25-6:2004 ED1
60.60 Standard published
May 26, 2004

National adoptions

SRPS EN 60512-25-6:2011  
ISS

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

60.60   Standard published

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