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IEC 63550-4 ED1

Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices

General information

40.60     Nov 28, 2025

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63550-4 ED1
40.60 Close of voting
Nov 28, 2025

National adoptions

Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices

40.60   Close of voting