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IEC 62047-51 ED1

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

General information

40.20     Dec 5, 2025

PRVC    Feb 27, 2026

IEC

TC 47/SC 47F

International Standard

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PROJECT
IEC 62047-51 ED1
40.20 DIS ballot initiated: 12 weeks
Dec 5, 2025

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