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IEC 62047-52 ED1

Semiconductor devices - Micro-electromechanical devices - Part 52: Biaxial tensile testing method for stretchable MEMS

General information

60.00     Jan 7, 2026

BPUB    Apr 1, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 62047-52 ED1
60.00 Standard under publication
Jan 7, 2026