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IEC 63551-5 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

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40.20     Jul 17, 2026

PRVC    Oct 9, 2026

IEC

TC 47

International Standard

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IEC 63551-5 ED1
40.20 DIS ballot initiated: 12 weeks
Jul 17, 2026

National adoptions

naSRPS EN IEC 63551-5:2026  
ISS

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

40.20   DIS ballot initiated: 12 weeks

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