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IEC 63551-5 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

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40.60     Oct 9, 2026

IEC

TC 47

International Standard

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NOW

PROJECT
IEC 63551-5 ED1
40.60 Close of voting
Oct 9, 2026

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naSRPS EN IEC 63551-5:2026  
ISS

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

40.60   Close of voting

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