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IEC 60749-11:2002/COR1:2003 ED1

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

General information

Current stage: 60.60 Effective date: Jan 30, 2003

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-11:2002 ED1

NOW

PUBLISHED
IEC 60749-11:2002/COR1:2003 ED1
60.60 Standard published
Jan 30, 2003