IEC 62047-56 ED1
Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
General information
Current stage:
40.20
Effective date:
Feb 13, 2026
Next stage: PRVC
Next stage date: May 8, 2026
Originator:
IEC
Owner:
TC 47/SC 47F
Type:
International Standard
ICS:
31.080.99
Buying
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Life cycle
NOW
PROJECT
IEC 62047-56 ED1
40.20
DIS ballot initiated: 12 weeks
Feb 13, 2026
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