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IEC 62047-56 ED1

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

General information

60.00     Oct 9, 2026

PPUB    Nov 20, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Scope

IEC 62047-56:2026(E) specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

Life cycle

NOW

PROJECT
IEC 62047-56 ED1
60.00 Standard under publication
Oct 9, 2026