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IEC TS 62607-12-01 ED1

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface trapped charges: I-V curve analysis of field effect transistors

General information

30.20     Jun 12, 2026

PCC    Aug 7, 2026

IEC

TC 113

Technical Specification

Life cycle

NOW

PROJECT
IEC TS 62607-12-01 ED1
30.20 CD study/ballot initiated
Jun 12, 2026

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