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IEC TS 62607-12-01 ED1

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors

General information

20.99     Nov 14, 2025

CD    Feb 5, 2027

IEC

TC 113

Technical Specification

Life cycle

NOW

PROJECT
IEC TS 62607-12-01 ED1
20.99 WD approved for registration as CD
Nov 14, 2025