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IEC 60749-4:2002/COR1:2003 ED1

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

General information

Current stage: 99.60 Effective date: Mar 3, 2017

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Scope

Modification of the validity date: now put at 2007.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-4:2002 ED1

NOW

WITHDRAWN
IEC 60749-4:2002/COR1:2003 ED1
99.60 Withdrawal effective
Mar 3, 2017

REVISED BY

PUBLISHED
IEC 60749-4:2017 ED2