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IEC 60749-8:2002/COR2:2003 ED1

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

General information

Current stage: 60.60 Effective date: Aug 12, 2003

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Scope

Modification of the validity date: now put at 2007.

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-8:2002 ED1

NOW

PUBLISHED
IEC 60749-8:2002/COR2:2003 ED1
60.60 Standard published
Aug 12, 2003