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IEC 60747-14-13 ED1

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

General information

30.20     Jun 5, 2026

PCC    Jul 31, 2026

IEC

TC 47/SC 47E

International Standard

31.080.01  

Life cycle

NOW

PROJECT
IEC 60747-14-13 ED1
30.20 CD study/ballot initiated
Jun 5, 2026

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