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IEC 62047-59 ED1

Semiconductor devices - Micro-electromechanical systems-Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

General information

30.20     Feb 6, 2026

PCC    Apr 3, 2026

IEC

TC 47/SC 47F

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 62047-59 ED1
30.20 CD study/ballot initiated
Feb 6, 2026

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