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IEC 63550-5 ED1

<p>Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices</p>

General information

30.20     Sep 4, 2026

PCC    Oct 30, 2026

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63550-5 ED1
30.20 CD study/ballot initiated
Sep 4, 2026

National adoptions

Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices

10.99   New project approved

N022 more

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