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IEC 63551-2 ED1

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR

General information

30.20     May 29, 2026

PCC    Jul 24, 2026

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

PROJECT
IEC 63551-2 ED1
30.20 CD study/ballot initiated
May 29, 2026

National adoptions

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of lidar

10.99   New project approved

N022 more

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