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PNW 47F-555 ED1

Semiconductor devices - Micro-electromechanical devices - Part 65: Test methods for electrical stimulation environment and Electrophysiological measurement using 3D Cell-tissues Models with MEMS chips

General information

10.20     Apr 24, 2026

PRVN    Jul 17, 2026

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

PROJECT
PNW 47F-555 ED1
10.20 New project ballot initiated
Apr 24, 2026