Revised
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
WITHDRAWN
IEC 60444-11:2010 ED1
99.60
Withdrawal effective
Apr 22, 2026
PUBLISHED
IEC 60444-11:2026 ED2