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IEC 60191-6-16 ED2

Semiconductor Packaging - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

General information

10.98     Oct 24, 2013

IEC

TC 47/SC 47D

International Standard

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60191-6-16:2007 ED1

NOW

ABANDON
IEC 60191-6-16 ED2
10.98 New project rejected
Oct 24, 2013