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IEC 61000-4-29:2000 ED1

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Aug 30, 2000

General information

99.60     Jul 30, 2026

IEC

TC 77/SC 77A

International Standard

33.100.20  

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Revised

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Scope

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.

Life cycle

NOW

WITHDRAWN
IEC 61000-4-29:2000 ED1
99.60 Withdrawal effective
Jul 30, 2026

REVISED BY

PUBLISHED
IEC 61000-4-29:2026 ED2

National adoptions

SRPS EN 61000-4-29:2008  
ISS

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

90.93   Standard confirmed

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