Published
Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.
PUBLISHED
ISO 8576:1996
90.20
Standard under periodical review
Apr 15, 2026
To view the full content, you need to register or to log in to your account by clicking on the "Log in" button