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ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Jul 15, 2003

General information

90.20     Jan 15, 2026

ISO

ISO/TC 171

International Standard

37.080  

English  

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Published

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Scope

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 6342:1993

NOW

PUBLISHED
ISO 6342:2003
90.20 Standard under periodical review
Jan 15, 2026

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