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ISO 21270:2004

Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale

Jun 15, 2004

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90.60     Sep 3, 2026

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

English  

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Scope

ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.

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ISO 21270:2004
90.60 Close of review
Sep 3, 2026