Phone: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Standards sales: prodaja@iss.rs Education: iss-edukacija@iss.rs Information about standards: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Main menu

ISO 21270:2004

Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale

Jun 15, 2004

General information

90.20     Apr 15, 2026

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

English  

Buying

Published

Language in which you want to receive the document.

Scope

ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.

Life cycle

NOW

PUBLISHED
ISO 21270:2004
90.20 Standard under periodical review
Apr 15, 2026

Preview

To view the full content, you need to register or to log in to your account by clicking on the "Log in" button

Login