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ISO 19830:2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Nov 5, 2015

General information

90.20     Apr 15, 2026

ISO

ISO/TC 201/SC 7

International Standard

71.040.40  

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Scope

ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

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PUBLISHED
ISO 19830:2015
90.20 Standard under periodical review
Apr 15, 2026

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