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ISO 23699:2026

Microbeam analysis — Electron backscatter diffraction — Vocabulary

Sep 28, 2026

General information

60.60     Sep 28, 2026

ISO

ISO/TC 202/SC 1

International Standard

01.040.71     71.040.50  

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Scope

This document defines terms used for the electron backscatter diffraction (EBSD) technique. This document covers both general and specific concepts classified according to their hierarchy in a systematic order.
This document is applicable to standardization documents relevant to EBSD practices. In addition, some definitions in this document are applicable to transmission Kikuchi diffraction (TKD).

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PUBLISHED
ISO 23699:2026
60.60 Standard published
Sep 28, 2026