20.00 Jun 23, 2026
ISO
ISO/TC 172/SC 5
International Standard
This document specifies procedures for the measurement of optical distortion for microscopy optical imaging. These measurements are defined in image planes or intermediate image planes only, when these planes are suitable for detection by electronic imaging devices. This document also specifies the information that is to be provided to the users. This document does not apply to confocal microscopes employing a scanner device for laser scanning.
PROJECT
ISO/AWI 24904
20.00
New project registered in TC/SC work programme
Jun 23, 2026