This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 25178-601. The calibration and adjustment specified within this document is intended to be carried out with the aid of measurement standards.
NOTE Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 25178-601.
PUBLISHED
SRPS EN ISO 12179:2022
PROJECT
dnaSRPS EN ISO 12179:2026
50.99
FDIS or proof approved for publication
Sep 18, 2026