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dnaSRPS EN IEC 61508-2-1:2026

Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 2-1: Requirements for semiconductors

General information

50.20     Oct 2, 2026

50.60    Nov 13, 2026

ISS

N065

European Norm

English  

Scope

IEC 61508-2-1:2026 outlines the requirements for the development and integration of semiconductors according to IEC 61508-1, IEC 61508-2 and IEC 61508-3. Additionally, this part outlines requirements for the integration of semiconductors not developed in accordance with the IEC 61508 series.
In particular, this document outlines requirements and recommendations for
- processes and methods for the development of semiconductors for single-channel and multi-channel applications;
- processes for the development of software test libraries for use in semiconductors developed to this part;
- processes and methods for development of soft-IP (circuits to be used in another design) used by developers of semiconductors;
- the expectations of deliverables by the semiconductors developers to the system integrators including use-case constraints;
- a roadmap for semiconductor developers and system integrators.
This document does not apply to simple semiconductor devices such as MOSFETS, transistors or diodes where all the failure modes are easily recognized and known.

Life cycle

NOW

PROJECT
dnaSRPS EN IEC 61508-2-1:2026
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Oct 2, 2026

Related project

Adopted from FprEN IEC 61508-2-1:2026 IDENTICAL

Adopted from IEC 61508-2-1 ED1 IDENTICAL

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