This document specifies a method for determining optical and dielectric constants in the UV-VIS-NIR
spectral range as well as layer thicknesses in the field of at-line production control, quality assurance and
material development through accredited test laboratories.
It is applicable to stand-alone measuring systems. The presentation of the uncertainty of results conforms
to ISO/IEC Guide 98-3.
PROJECT
prSRPS EN ISO 23131-2:2026
10.99
New project approved
Aug 20, 2026